Expected travel time and optimal boundary formulas for a two-class-based automated storage/retrieval system

No Thumbnail Available
Authors
Kouvelis, Panos
Papanicolaou, Vassilis G.
Advisors
Issue Date
1995
Type
Article
Keywords
Cranes , Factory automation , Materials handling , Mathematical models , Operations research , Storage (materials) , Automated storage/retrieval system , Optimal boundary , Travel time , Warehouses
Research Projects
Organizational Units
Journal Issue
Citation
KOUVELIS, P., & PAPANICOLAOU, V. (1995). Expected travel time and optimal boundary formulas for a two-class-based automated storage/retrieval system. International Journal of Production Research, 33(10), 2889–2905. https://doi.org/10.1080/00207549508904851
Abstract

Our paper studies a two-class-based rectangular-in-time automated storage/retrieval system (AS/RS). We present explicit formulas for the optima! boundary of the two storage areas as well as for the expected single command cycle time for an optimally designed rack. In the basic model each crane handles a single aisle. These formulas provide the designer with a full picture of the quantitative effects of the various factors (i.e., access frequencies of the two storage areas, and dimensions of the rack) on the optimal boundary of the two storage areas and the achievable cycle lime in the warehouse. We also develop expected travel time formulas for the dual command AS/RS with two-class-based storage policies and obtain the optimal boundary with a one-dimensional search procedure. Similar developments (i.e., expected travel time formulas and optimal boundary search procedures) are discussed for AS/RS with a single command policy but with each crane handling multiple aisles. © 1995 Taylor & Francis Group, LLC. © 2016 Elsevier B.V., All rights reserved.

Table of Contents
Description
Click on the DOI link to access this article at the publisher's website(may not be free).
Publisher
Taylor & Francis
Journal
International Journal of Production Research
Book Title
Series
PubMed ID
ISSN
1366-588X
0020-7543
EISSN