Undetectability of bridging faults and validity of stuck-at fault test sets
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Authors
Kodandapani, K.L.
Pradhan, D.K.
Advisors
Issue Date
1980-01-01
Type
Article
Keywords
Circuit faults , Circuit testing , Combinational circuits , DH-HEMTs , Electrical fault detection , Fault detection , Large scale integration , Redundancy , Sequential circuits , Sufficient conditions
Citation
Kodandapani, K.L.; Pradhan, D.K.; , "Undetectability of Bridging Faults and Validity of Stuck-At Fault Test Sets," Computers, IEEE Transactions on , vol.C-29, no.1, pp.55-59, Jan. 1980
doi: 10.1109/TC.1980.1675457
Abstract
The study of bridging faults (or short circuits that occur between conducting paths) has become increasingly important with the advent of LSI technology. To date, only a very few papers have been published on this topic. Specifically, little is known regarding undetectable bridging faults. More importantly, what has yet to be explored are the effects of undetectable bridging faults on the tests designed to detect stuck-at faults.
Table of Contents
Description
The full text of this article is not available on SOAR. WSU users can access the article via IEEE Xplore database licensed by University Libraries: http://libcat.wichita.edu/vwebv/holdingsInfo?bibId=1045954
Publisher
IEEE
Journal
Book Title
Series
Computers, IEEE Transactions on , vol.C-29, no.1, pp.55-59
PubMed ID
DOI
ISSN
0018-9340