Analysis of the strain profile in thin Au/Ni multilayers by x-ray diffraction
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Authors
Chaudhuri, J.
Gondhalekar, V.
Jankowski, A. F.
Advisors
Issue Date
1992-04-01
Type
Article
Keywords
Depth profiles
Citation
Chaudhuri, J.; Gondhalekar, V.; Jankowski, A. F.; , "Analysis of the strain profile in thin Au/Ni multilayers by x-ray diffraction," Journal of Applied Physics , vol.71, no.8, pp.3816-3820, Apr 1992
doi: 10.1063/1.350896
Abstract
The strain relaxation in Au/Ni multilayers was analyzed in detail using a dynamical theory of x-ray diffraction. The depth profile of strain in the modulation direction was determined by an iterative fitting of the calculated rocking curve with the experimental one. The repeat periods of Au/Ni multilayers used in this study range from 0.82 to 9.0 nm. The analysis indicates that the theoretical x-ray patterns are extremely sensitive to the amount of strain at the interface.
Table of Contents
Description
The full text of this article is not available on SOAR. WSU users can access the article via IEEE Xplore database licensed by University Libraries: http://libcat.wichita.edu/vwebv/holdingsInfo?bibId=1045954
Publisher
IEEE
Journal
Book Title
Series
Journal of Applied Physics , vol.71, no.8, pp.3816-3820
PubMed ID
DOI
ISSN
0021-8979