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A sequential Bayesian cumulative conformance control chart for high yield processes
Toubia, Gracia J.
Toubia, Gracia J.
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Dissertation
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2009-05
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Electronic dissertations
Electronic dissertations
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Abstract
For mass production, the traditional approach of drawing the confidence limits was
satisfactory when many bad units were being produced; however, the same approach becomes
ineffective for high yield processes, when the defective rates have small magnitudes, such as
parts per million. In particular, the traditional p-control charts used to control nonconformance
rates present many problems when p, the rate of nonconformance, is small. One problem is an
increase in the probability of false alarm, and another is the increase in sample size, sometimes
making the extremely large size of the sample prohibitive. The biggest problem with the pcontrol
chart is discussed by Brown, Cai and DasGupta (2001), where the theory of the normal
approximation to the binomial distribution is debunked and the need for rewriting the chapter on
binomial distribution in statistics textbooks is suggested. Many rejoinders to this work also
agree on this important discussion.
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Thesis (Ph.D.)--Wichita State University, College of Engineering, Dept. of Industrial and Manufacturing Engineering
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Wichita State University