Structure and magnetic properties of sputtered thin films of Fe0.79Ge0.21

dc.contributor.authorHamdeh, Hussein H.en_US
dc.contributor.authorOliver, S. A.en_US
dc.contributor.authorFultz, B.en_US
dc.contributor.authorGao, Z. Q.en_US
dc.date.accessioned2011-12-20T23:52:19Z
dc.date.available2011-12-20T23:52:19Z
dc.date.issued1993-10-01en_US
dc.descriptionThe full text of this article is not available on SOAR. WSU users can access the article via IEEE Xplore database licensed by University Libraries: http://libcat.wichita.edu/vwebv/holdingsInfo?bibId=1045954en_US
dc.description.abstractFilms of Fe0.79Ge0.21 with thicknesses of 300 nm were synthesized by ion beam sputtering, and were annealed at temperatures from 200 to 550°C. The materials were characterized by x-ray diffractometry, Mössbauer spectrometry, vibrating sample magnetometry, ferromagnetic resonance spectrometry, and electrical resistivity measurements. The as-prepared materials comprised chemically disordered bcc crystallites of sizes less than 20 nm, and were found to have a distribution of internal strains. Upon annealing at temperatures of 250°C and below, there occurred strain relaxation, some evolution of short range chemical order, and an improvement in soft magnetic properties. The coercive field was a minimum for the sample annealed at 250°C. Crystallite growth occurred at higher annealing temperatures, accompanied by a transition in several measured parameters from those of ultrafine grained materials to those typical of polycrystalline materials. This trend can be explained with the random anisotropy model. Mössbauer and magnetization measurements indicated that the Ge atoms behave as magnetic holes. The 57Fe hyperfine magnetic field distribution, and its change during chemical ordering, can be calculated approximately with a model of magnetic response. The large local isomer shifts at 57Fe atoms near Ge atoms suggest that a local depletion of 4s conduction electron density should be incorporated into the model.en_US
dc.description.versionPeer reviewed articleen_US
dc.identifier.citationHamdeh, H. H.; Oliver, S. A.; Fultz, B.; Gao, Z. Q.; , "Structure and magnetic properties of sputtered thin films of Fe0.79Ge0.21," Journal of Applied Physics , vol.74, no.8, pp.5117-5123, Oct 1993 doi: 10.1063/1.354298en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.354298en_US
dc.identifier.urihttp://hdl.handle.net/10057/4078
dc.language.isoen_USen_US
dc.publisherIEEEen_US
dc.relation.ispartofseriesJournal of Applied Physics , vol.74, no.8, pp.5117-5123en_US
dc.rights.holder© IEEE, 1993en_US
dc.titleStructure and magnetic properties of sputtered thin films of Fe0.79Ge0.21en_US
dc.typeArticleen_US
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