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dc.contributor.authorMa, Chunsheng
dc.date.accessioned2013-07-25T17:13:55Z
dc.date.available2013-07-25T17:13:55Z
dc.date.issued2007-03
dc.identifier.citationMa, Chunsheng (2007). "Planar-Temporal Stationary Correlation Models That Depend on the Maximum Norm." Signal Processing, IEEE Transactions on 55(3): 889-896.en_US
dc.identifier.issn1053-587X
dc.identifier.urihttp://hdl.handle.net/10057/6054
dc.identifier.urihttp;//dx.doi.org/10.1109/TSP.2006.888062
dc.descriptionClick on the DOI link to access the article (may not be free)en_US
dc.description.abstractIt is useful to have various stochastic models to describe a wide range of spatial or spatio-temporal dependence and interaction. Two families of planar-temporal stationary correlation functions are proposed in this paper, whose planar margins are functions of the maximum norm on the plane. We formulate each of these two families through a simple development base that possesses a rational spectral density. The base for one family is the linear combination of two separable planar-temporal correlation models, while there seems to be no easy interpretation for the base of the other family. Each family is then generated by appropriately randomizing the planar and temporal coordinates of the base random field. One may treat each family as a semiparametric model, whose permissible parameter domains are identified. A common feature of the models developed is that they allow for describing positive and negative correlations. Other properties are also presented.en_US
dc.language.isoen_USen_US
dc.publisherIEEEen_US
dc.relation.ispartofseriesSignal Processing, IEEE Transactions on;v.55 no.3
dc.subjectCorrelation function, covariance, Fourier transform, isotropic, power-law decay, spectral density, stationary.en_US
dc.subjectCorrelation function
dc.subjectCovariance
dc.subjectFourier transform
dc.subjectIsotropic
dc.subjectPower-law decay
dc.subjectSpectral density
dc.subjectStationary
dc.titlePlanar-temporal stationary correlation models that depend on the maximum normen_US
dc.typeArticleen_US
dc.description.versionPeer reviewed
dc.rights.holderCopyright © 2007, IEEE


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