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dc.contributor.advisorMeyer, Fred J.en_US
dc.contributor.authorBeard, Mary Jean
dc.descriptionThesis (M.S.)--Wichita State University, College of Engineering, Dept. of Electrical and Computer Engineeringen
dc.description"July 2006."en
dc.descriptionIncludes bibliographic references (leaves 31-33)en
dc.description.abstractThis paper details the design and simulation of a fault-tolerant Quantum-dot Cellular Automata (QCA) NOT gate. A version of the standard NOT gate can be constructed to take advantage to the ability to easily integrate redundant structures into a QCA design. The fault-tolerant characteristics of this inverter are analyzed with QCADesigner v2.0.3 (Windows version) simulation software. These characteristics are then compared with the characteristics of two other non-redundant styles of NOT gates. The redundant version of the gate is more robust than the standard style for the inverter. However, another simple inverter style seems to be even more than this fault-tolerant design. Both versions of the gate will need to be studied further in the future to determine which design is most practical.en
dc.format.extent[vii], 33 leaves: ill., digital, PDF file.
dc.format.extent331552 bytes
dc.rightsCopyright Mary Jean Beard, 2006. All rights reserved.en
dc.subjectQuantum-Dot Cellular Automataen
dc.subjectDigital Logic Gateen
dc.subject.lcshElectronic dissertationsen
dc.titleDesign and simulation of fault-tolerant Quantum-dot Cellular Automata (QCA) NOT gatesen

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  • CE Theses and Dissertations
    Doctoral and Master's theses authored by the College of Engineering graduate students
  • EECS Theses and Dissertations
    Collection of Master's theses and Ph.D. dissertations completed at the Dept. of Electrical Engineering and Computer Science
  • Master's Theses
    This collection includes Master's theses completed at the Wichita State University Graduate School (Fall 2005 --)

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