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dc.contributor.authorLi, Xiaoboen_US
dc.contributor.authorDubes, Richard C.en_US
dc.identifier.citationLi, Xiaobo; Dubes, Richard C.; , "The First Stage in Two-Stage Template Matching," Pattern Analysis and Machine Intelligence, IEEE Transactions on , vol.PAMI-7, no.6, pp.700-707, Nov. 1985 doi: 10.1109/TPAMI.1985.4767726en_US
dc.descriptionThe full text of this article is not available on SOAR. WSU users can access the article via IEEE Xplore database licensed by University Libraries:
dc.description.abstractThis paper formulates the problem encountered in the first stage of two-stage, binary template matching as a set of hypotheses to be tested, including a hypothesis of "no object." Two new statistics R and G are proposed, based on a likelihood ratio, and are compared to the sum of absolute differences and a correlation measure by analytical approximations and Monte Carlo experiments. Statistical power and a measure of sensitivity to the true location of the object are the criteria. Parameters are the numbers of 1's in object and image, subtemplate size, and parameters reflecting intensity distortion between template and object. One of the proposed statistics R is much more computationally intensive than the other G. Although R is more powerful than G and the other statistics, G is generally more sensitive to the true object location. Statistic G is also more powerful than the sum of absolute differences and correlation. All statistics are robust to incomplete knowledge of distortion parameters. Experiments on Landsat images confirm the sensitivity of G and recommend it for application in the first stage.en_US
dc.relation.ispartofseriesPattern Analysis and Machine Intelligence, IEEE Transactions on , vol.PAMI-7, no.6, pp.700-707en_US
dc.subjectApplication softwareen_US
dc.subjectComputer errorsen_US
dc.subjectDistortion measurementen_US
dc.subjectImage registrationen_US
dc.subjectRemote sensingen_US
dc.subjectStatistical analysisen_US
dc.titleThe first stage in two-stage template matchingen_US
dc.description.versionPeer reviewed articleen_US
dc.rights.holder© IEEE, 1985en_US

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