Undetectability of bridging faults and validity of stuck-at fault test sets
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Kodandapani, K.L.; Pradhan, D.K.; , "Undetectability of Bridging Faults and Validity of Stuck-At Fault Test Sets," Computers, IEEE Transactions on , vol.C-29, no.1, pp.55-59, Jan. 1980 doi: 10.1109/TC.1980.1675457
The study of bridging faults (or short circuits that occur between conducting paths) has become increasingly important with the advent of LSI technology. To date, only a very few papers have been published on this topic. Specifically, little is known regarding undetectable bridging faults. More importantly, what has yet to be explored are the effects of undetectable bridging faults on the tests designed to detect stuck-at faults.
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