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    Design of robust layout for Dynamic Plant Layout Problems

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    Krishnan_2011 (244.3Kb)
    Date
    2011
    Author
    Pillai, V. Madhusudanan
    Hunagund, Irappa Basappa
    Krishnan, Krishna K.
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    Citation
    Madhusudanan Pillai, V., I.B. Hunagund, and K.K. Krishnan. 2011. "Design of robust layout for Dynamic Plant Layout Problems". Computers & Industrial Engineering, 61(3), pp:813-823.
    Abstract
    In this paper, a design for robust facility layout is proposed under the dynamic demand environment. The general strategy for a multi period layout planning problem is adaptive approach. This approach for Dynamic Plant Layout Problem (DPLP) assumes that a layout will accommodate changes from time to time with low rearrangement and production interruption costs, and that the machines can be easily relocated. On the other hand the robust layout approach, assumes that rearrangement and production interruption costs are too high and hence, tries to minimize the total material handling costs in all periods using a single layout. Robust approach suggests a single layout for multiple scenarios as well as for multiple periods. As a solution procedure for the proposed model, a Simulated Annealing (SA) algorithm is suggested, which perform well for the problems from literature and QAPLIB website. The application of suggested model for robust layout to cellular layouts has given better results compared to the robust cellular layout model of literature. For the standard DPLP of the literature, the solution values of the suggested model are very near to the results of adaptive approach. The Total Penalty Cost (TPC) is used to test the suitability of the suggested layout to be a robust layout for the given data set. TPC values indicate that the suggested layout is suitable as robust layout for the given data sets.
    Description
    The full text of this article is not available on SOAR. WSU users can access the article via database licensed by University Libraries: http://libcat.wichita.edu/vwebv/holdingsInfo?bibId=1375033
    URI
    http://hdl.handle.net/10057/4000
    http://dx.doi.org/ 10.1016/j.cie.2011.05.014
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