Browsing CS Research Publications by Subject "Circuit testing"
Now showing items 1-2 of 2
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A cellular array for multivalued logic functions
(IEEE, 1978-11)An algebraic generalization of the well-known binary q-function array to a multivalued q-function array is presented. It is possible to associate tree-structure realizations for binary q-functions and multivalued q-functions. ... -
Undetectability of bridging faults and validity of stuck-at fault test sets
(IEEE, 1980-01-01)The study of bridging faults (or short circuits that occur between conducting paths) has become increasingly important with the advent of LSI technology. To date, only a very few papers have been published on this topic. ...