Browsing CS Research Publications by Subject "Circuit testing"

Now showing items 1-2 of 2

    • A cellular array for multivalued logic functions 

      Kodandapani, K.L.; Setlur, R.V. (IEEE, 1978-11)
      An algebraic generalization of the well-known binary q-function array to a multivalued q-function array is presented. It is possible to associate tree-structure realizations for binary q-functions and multivalued q-functions. ...

    • Undetectability of bridging faults and validity of stuck-at fault test sets 

      Kodandapani, K.L.; Pradhan, D.K. (IEEE, 1980-01-01)
      The study of bridging faults (or short circuits that occur between conducting paths) has become increasingly important with the advent of LSI technology. To date, only a very few papers have been published on this topic. ...