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dc.contributor.authorKahai, P.
dc.contributor.authorSrinivasan, Manivannan
dc.contributor.authorNamuduri, Kameswara
dc.contributor.authorPendse, Ravi
dc.date.accessioned2011-11-08T17:22:49Z
dc.date.available2011-11-08T17:22:49Z
dc.date.issued2005-02
dc.identifier.citationP. Kahai, M. Srinivasan, K. R. Namuduri, and R. Pendse, Forensic profiling system Proceedings of the IFIP WG 11.9 First International Conference on Digital Forensics, Orlando, Florida. February 2005.en_US
dc.identifier.urihttp://hdl.handle.net/10057/3885
dc.descriptionFull text of this article is not available due to publisher's copyright restrictions.en_US
dc.language.isoen_USen_US
dc.relation.ispartofseriesProceedings of the IFIP WG 11.9 First International Conference on Digital Forensics;February 2005.
dc.titleForensic profiling systemen_US
dc.typeConference paperen_US


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