Now showing items 1-2 of 2

    • Degradation modeling with long-term memory considering measurement errors 

      Shao, Yunfei; Si, Wujun (IEEE, 2021-12-23)
      With the advancement of measurement technology, the long-term memory (LTM) effect within the degradation data of many assets has recently been detected, which implies that the future degradation process highly correlates ...
    • Sub-system based reliability assessment for distribution transformer 

      Rahman, Md Rakib Ur; Aravinthan, Visvakumar (IEEE, 2016-12-15)
      Implementation of Smart Grid into the power system has made our grid more robust and reliable. Due to integration of two-way, real time communication it is possible to monitor equipment through sensors. Continuous monitoring ...