Browsing Engineering by Type "Postprint"
Now showing items 1-2 of 2
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Degradation modeling with long-term memory considering measurement errors
(IEEE, 2021-12-23)With the advancement of measurement technology, the long-term memory (LTM) effect within the degradation data of many assets has recently been detected, which implies that the future degradation process highly correlates ... -
Sub-system based reliability assessment for distribution transformer
(IEEE, 2016-12-15)Implementation of Smart Grid into the power system has made our grid more robust and reliable. Due to integration of two-way, real time communication it is possible to monitor equipment through sensors. Continuous monitoring ...