Browsing Engineering by Title
Now showing items 3424-3428 of 3428
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An x-ray diffraction method for measuring thicknesses of epitaxial thin films
(IEEE, 1989-12)An x-ray diffraction technique capable of measuring the thicknesses of epitaxial thin films with high precision is described. The advantages of this method are that it is nondestructive, straightforward, and rapidly ... -
X-ray double crystal characterization of single crystal epitaxial aluminum nitride thin films on sapphire, silicon carbide and silicon substrates
(IEEE, 1995-06-01)A detailed double crystal x-ray diffractometry study of epitaxial AlN thin films grown on sapphire, silicon and silicon carbide substrates was carried out to compare the structure, residual stress and defect concentration ... -
Zero-forcing precoder: a special constructive interference precoder for PSK signals
(IEEE, 2020-03-30)Recently, constructive interference precoders have been considered for downlink communication systems to utilize the multiuser interference constructively. Such precoders are normally obtained by solving constrained ... -
The zoom FFT using complex modulation
(IEEE, 1977-05-01)A recent paper by Yip discussed the zoom transform as derived from the defining equation of the FFT. This paper simplifies the concepts and removes some of the restrictions assumed by Yip; ie., the total number of points ... -
Zoom-based super-resolution image reconstruction from images with different orientations
(2006-12)Construction of a mosaic image using a set of low resolution images taken at different zoom settings and at different angles was investigated in this thesis. The proposed reconstruction algorithm uses the zoom based super ...