Browsing Mechanical Engineering by Author "Hashmi, F."
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Determination of thickness of multiple layer thin films by an x-ray-diffraction technique
Chaudhuri, J.; Hashmi, F. (IEEE, 1994-10-01)An x-ray-diffraction method for determining the thickness of multiple layer thin films grown on a single-crystal substrate is presented. The equations, based on the kinematical theory of x-ray diffraction and the mosaic ...