Analysis of the strain profile in thin Au/Ni multilayers by x-ray diffraction
Chaudhuri, J. Gondhalekar, V. Jankowski, A. F.
Chaudhuri, J.
Gondhalekar, V.
Jankowski, A. F.
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Authors
Chaudhuri, J.
Gondhalekar, V.
Jankowski, A. F.
Gondhalekar, V.
Jankowski, A. F.
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1992-04-01
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Article
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Depth profiles
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Chaudhuri, J.; Gondhalekar, V.; Jankowski, A. F.; , "Analysis of the strain profile in thin Au/Ni multilayers by x-ray diffraction," Journal of Applied Physics , vol.71, no.8, pp.3816-3820, Apr 1992
doi: 10.1063/1.350896
Abstract
The strain relaxation in Au/Ni multilayers was analyzed in detail using a dynamical theory of x-ray diffraction. The depth profile of strain in the modulation direction was determined by an iterative fitting of the calculated rocking curve with the experimental one. The repeat periods of Au/Ni multilayers used in this study range from 0.82 to 9.0 nm. The analysis indicates that the theoretical x-ray patterns are extremely sensitive to the amount of strain at the interface.
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The full text of this article is not available on SOAR. WSU users can access the article via IEEE Xplore database licensed by University Libraries: http://libcat.wichita.edu/vwebv/holdingsInfo?bibId=1045954
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IEEE
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Journal of Applied Physics , vol.71, no.8, pp.3816-3820
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0021-8979