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Effects of encapsulant on thru-reflect-line calibrations within the frequency band for automotive radar
Dixon, Ethen
Dixon, Ethen
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t25006_Dixon.pdf
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2025-05
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Testing semiconductors in the frequency band of 77-81GHz is of increasing importance, since many companies are producing technology for Automotive radar in this bandwidth and therefore must subject their products to the automotive qualification process. Providing reliable, high quality data at such high frequencies is challenging. Direct bonding of semiconductors to the printed circuit boards (PCBs) and using chip-on-board (COB) technology is advised to limit the impact that connections to the device under test (DUT) have on the data, but these methods also often require protection or support through the use of encapsulant covering the DUT. Encapsulant can also have a significant impact on high frequency measurements. This thesis looks at the impact encapsulant has on a thru-reflect-line (TRL) calibration used in the 77-81GHz bandwidth, and explores methods for accounting for the error produced by the encapsulant on the calibration. This thesis also demonstrates that Newton’s method for approximation can be used with a high level of confidence to solve the nonlinear system of equations produced by a realistic TRL calibration.
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Thesis (M.S.)-- Wichita State University, College of Engineering, Dept. of Electrical and Computer Engineering
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Wichita State University
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© Copyright 2025 by Ethen Dixon
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