| dc.contributor.author |
Sawan, M. Edwin |
en_US |
| dc.contributor.author |
Cruz, J. B. |
en_US |
| dc.date.accessioned |
2011-12-21T20:17:54Z |
|
| dc.date.available |
2011-12-21T20:17:54Z |
|
| dc.date.issued |
1979-12-01 |
en_US |
| dc.identifier.citation |
M. E. Sawan; J. B. Cruz; , "Optimal control systems with low sensitivity to small time delays," Decision and Control including the Symposium on Adaptive Processes, 1979 18th IEEE Conference on , vol.18, no., pp.45-48, Dec. 1979
doi:10.1109/CDC.1979.270135 |
en_US |
| dc.identifier.uri |
http://dx.doi.org/10.1109/CDC.1979.270135 |
en_US |
| dc.identifier.uri |
http://hdl.handle.net/10057/4114 |
|
| dc.description |
The full text of this article is not available on SOAR. WSU users can access the article via IEEE Xplore database licensed by University Libraries: http://libcat.wichita.edu/vwebv/holdingsInfo?bibId=1045954 |
en_US |
| dc.description.abstract |
The problem of reducing trajectory sensitivity to small time delays is considered. State and output feedback gains are computed, so that the system performs optimally with low sensitivity. The delay is assumed to be expected to occur in the plant or in the feedback path. Numerical examples are discussed. |
en_US |
| dc.language.iso |
en_US |
en_US |
| dc.publisher |
IEEE |
en_US |
| dc.relation.ispartofseries |
Decision and Control including the Symposium on Adaptive Processes, 1979 18th IEEE Conference on , vol.18, no., pp.45-48 |
en_US |
| dc.subject |
Delay effects |
en_US |
| dc.subject |
Delay systems |
en_US |
| dc.subject |
Energy measurement |
en_US |
| dc.subject |
Gold |
en_US |
| dc.subject |
Optimal control |
en_US |
| dc.subject |
Output feedback |
en_US |
| dc.subject |
Q measuremen |
en_US |
| dc.subject |
State feedback |
en_US |
| dc.subject |
Time measurement |
en_US |
| dc.title |
Optimal control systems with low sensitivity to small time delays |
en_US |
| dc.type |
Conference paper |
en_US |
| dc.description.version |
Peer reviewed article |
en_US |
| dc.rights.holder |
© IEEE, 1979 |
en_US |