Analysis of the strain profile in thin Au/Ni multilayers by x-ray diffraction

Chaudhuri, J.; Gondhalekar, V.; Jankowski, A. F.

Analysis of the strain profile in thin Au/Ni multilayers by x-ray diffraction

Issue Date

1992-04-01

Authors

Chaudhuri, J.

Gondhalekar, V.

Jankowski, A. F.

Full item page

Citation

Chaudhuri, J.; Gondhalekar, V.; Jankowski, A. F.; , "Analysis of the strain profile in thin Au/Ni multilayers by x-ray diffraction," Journal of Applied Physics , vol.71, no.8, pp.3816-3820, Apr 1992 doi: 10.1063/1.350896

Abstract

The strain relaxation in Au/Ni multilayers was analyzed in detail using a dynamical theory of x-ray diffraction. The depth profile of strain in the modulation direction was determined by an iterative fitting of the calculated rocking curve with the experimental one. The repeat periods of Au/Ni multilayers used in this study range from 0.82 to 9.0 nm. The analysis indicates that the theoretical x-ray patterns are extremely sensitive to the amount of strain at the interface.

Description

The full text of this article is not available on SOAR. WSU users can access the article via IEEE Xplore database licensed by University Libraries: http://libcat.wichita.edu/vwebv/holdingsInfo?bibId=1045954

URI

http://dx.doi.org/10.1063/1.350896
http://hdl.handle.net/10057/4061

Collections

ME Research Publications