| dc.contributor.author |
Kodandapani, K.L. |
en_US |
| dc.contributor.author |
Pradhan, D.K. |
en_US |
| dc.date.accessioned |
2011-12-20T21:01:35Z |
|
| dc.date.available |
2011-12-20T21:01:35Z |
|
| dc.date.issued |
1980-01-01 |
en_US |
| dc.identifier.citation |
Kodandapani, K.L.; Pradhan, D.K.; , "Undetectability of Bridging Faults and Validity of Stuck-At Fault Test Sets," Computers, IEEE Transactions on , vol.C-29, no.1, pp.55-59, Jan. 1980
doi: 10.1109/TC.1980.1675457 |
en_US |
| dc.identifier.issn |
0018-9340 |
en_US |
| dc.identifier.uri |
http://dx.doi.org/10.1109/TC.1980.1675457 |
en_US |
| dc.identifier.uri |
http://hdl.handle.net/10057/4047 |
|
| dc.description |
The full text of this article is not available on SOAR. WSU users can access the article via IEEE Xplore database licensed by University Libraries: http://libcat.wichita.edu/vwebv/holdingsInfo?bibId=1045954 |
en_US |
| dc.description.abstract |
The study of bridging faults (or short circuits that occur between conducting paths) has become increasingly important with the advent of LSI technology. To date, only a very few papers have been published on this topic. Specifically, little is known regarding undetectable bridging faults. More importantly, what has yet to be explored are the effects of undetectable bridging faults on the tests designed to detect stuck-at faults. |
en_US |
| dc.language.iso |
en_US |
en_US |
| dc.publisher |
IEEE |
en_US |
| dc.relation.ispartofseries |
Computers, IEEE Transactions on , vol.C-29, no.1, pp.55-59 |
en_US |
| dc.subject |
Circuit faults |
en_US |
| dc.subject |
Circuit testing |
en_US |
| dc.subject |
Combinational circuits |
en_US |
| dc.subject |
DH-HEMTs |
en_US |
| dc.subject |
Electrical fault detection |
en_US |
| dc.subject |
Fault detection |
en_US |
| dc.subject |
Large scale integration |
en_US |
| dc.subject |
Redundancy |
en_US |
| dc.subject |
Sequential circuits |
en_US |
| dc.subject |
Sufficient conditions |
en_US |
| dc.title |
Undetectability of bridging faults and validity of stuck-at fault test sets |
en_US |
| dc.type |
Article |
en_US |
| dc.description.version |
Peer reviewed article |
en_US |
| dc.rights.holder |
© IEEE,1980 |
en_US |