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Browsing ME Faculty Publications by Title

Now showing items 25-33 of 33

Tensile loading behavior of carbon nanotube wires

Sabelkin, V.; Misak, Heath Edward; Mall, S.; Asmatulu, Ramazan; Kladitis, P.E. (Elsevier, 2012-02-08)

The mechanical behavior of four carbon nanotube (CNT) wires, comprised of 1-yarn, 30-yarn, 60-yarn, and 100-yarn, was investigated under constant tension at two loading rates of 0.02 mm/sec and 2 mm/sec. Tests were conducted ...
Tension-tension fatigue behavior of carbon nanotube wires

Misak, Heath Edward; Asmatulu, Ramazan; Sabelkin, V.; Mall, S.; Kladitis, P.E. (Elsevier, 2012-09-23)

The tension-tension fatigue behavior of three types of as-received carbon nanotube (CNT) wires, comprising of 30-yarn, 60-yarn, and 100-yarn, was investigated. Fatigue tests were conducted at 35, 50, 60, 75 and 80% of their ...
Thermal conductivities of electrospun PAN and PVP nanocomposite fibers incorporated with MWCNTs and NiZn ferrite nanoparticles

Khan, Waseem S.; Asmatulu, Ramazan; Ahmed, Ikramuddin; Ravigururajan, Tiruvadi S. (Elsevier, 2013)

Polyacrylonitrile (PAN) and polyvinylpyrrolidone (PVP) solutions incorporated with multi wall carbon nanotubes (MWCNTs) and NiZn ferrite (Ni0.6Zn0.4Fe2O4) nanoparticles were electrospun at various weight percentages, and ...
Thermal, rheological, and mechanical properties of a polymer composite cured at different isothermal cure temperatures

Alavi-Soltani, Seyed R.; Sabzevari, Seyed Mostafa; Koushyar, Hoda; Minaie, Bob (SAGE Publications, 2012-03)

Thermal, rheological, and mechanical properties of a commercial carbon fiber epoxy prepreg, Cycom 977-2 UD, were obtained for isothermal cure temperatures ranging from 149°C to 182°C. For each cure profile, an encapsulated-sample ...
Thickness measurement of thin films by x-ray absorption

Chaudhuri, J.; Shah, S. (IEEE, 1991-01)

An x-ray diffraction method for determining thicknesses of thin films grown on single-crystal substrates is presented. The equations, based on the kinematical theory of x-ray diffraction and the mosaic crystal model, were ...
Use of a head component tester to evaluate the injury potential of an aircraft head-up display

DeWeese, Richard; Moorcroft, David; Thorbole, Chandrashekhar K.; Lankarani, Hamid M. (Taylor & Francis, 2011-08)

Title 14 of the Code of Federal Regulations Part 25, 25.785 requires that seats and adjacent parts of the airplane be designed so that occupants will not suffer serious injury during an emergency landing as a result of ...
Use of Euler parameters for the evaluation of ATD head trajectory from angular rate sensor and accelerometer data in aircraft seat certification testing

Huculak, Robert D.; Lankarani, Hamid M. (Taylor & Francis, Inc, 2013-04-01)

As part of the requirements of the US Federal regulations and the Society of Automotive Engineers (SAE) Aerospace Standard 8049B, when testing of the seat and adjacent parts of the aircraft may be impractical or unknown ...
An x-ray diffraction method for measuring thicknesses of epitaxial thin films

Chaudhuri, J.; Shah, S.; Harbison, J. P. (IEEE, 1989-12)

An x-ray diffraction technique capable of measuring the thicknesses of epitaxial thin films with high precision is described. The advantages of this method are that it is nondestructive, straightforward, and rapidly ...
X-ray double crystal characterization of single crystal epitaxial aluminum nitride thin films on sapphire, silicon carbide and silicon substrates

Chaudhuri, J.; Thokala, R.; Edgar, J. H.; Sywe, B. S. (IEEE, 1995-06-01)

A detailed double crystal x-ray diffractometry study of epitaxial AlN thin films grown on sapphire, silicon and silicon carbide substrates was carried out to compare the structure, residual stress and defect concentration ...