Browsing Engineering by Title

Now showing items 973-976 of 976

An x-ray diffraction method for measuring thicknesses of epitaxial thin films

Chaudhuri, J.; Shah, S.; Harbison, J. P. (IEEE, 1989-12)

An x-ray diffraction technique capable of measuring the thicknesses of epitaxial thin films with high precision is described. The advantages of this method are that it is nondestructive, straightforward, and rapidly ...
X-ray double crystal characterization of single crystal epitaxial aluminum nitride thin films on sapphire, silicon carbide and silicon substrates

Chaudhuri, J.; Thokala, R.; Edgar, J. H.; Sywe, B. S. (IEEE, 1995-06-01)

A detailed double crystal x-ray diffractometry study of epitaxial AlN thin films grown on sapphire, silicon and silicon carbide substrates was carried out to compare the structure, residual stress and defect concentration ...
Zoom-based super-resolution image reconstruction from images with different orientations

Jayasooriya, Chandana K.K. (2006-12)

Construction of a mosaic image using a set of low resolution images taken at different zoom settings and at different angles was investigated in this thesis. The proposed reconstruction algorithm uses the zoom based super ...
The zoom FFT using complex modulation

Hoyer, E.A.; Stork, R. (IEEE, 1977-05-01)

A recent paper by Yip discussed the zoom transform as derived from the defining equation of the FFT. This paper simplifies the concepts and removes some of the restrictions assumed by Yip; ie., the total number of points ...